Patent

Defect Sample Synthesis Method, Training Method of Defect Inspection Network, Computer-Readable Medium, Computing System, and Image Inspection Apparatus

（缺陷樣本合成方法、缺陷檢查網路之訓練方法、電腦可讀取媒體、計算系統以及圖像檢查裝置）

Inventors: Gongjie Zhang, Kaiwen Cui, Shijian Lu and Tzuyi Hung.

Proprietor: Delta Electronics Int’l (Singapore)   台達電子國際（新加坡）

• Singapore Patent Application Number: 10202114457P (Pending for publication)
• China Patent Number: CN114693595A (Issued 1st July 2022)
• Taiwan, Penghu, Kinmen, and Matsu (Separate Customs Territory) Patent Number: 202228069 (Issued 16th July 2022)